EM Clamps

The CLEM-6146 Electromagnetic, or ‘EM’ Clamp is designed for use as a clamp injection device for conducted immunity tests in the frequency range of 150 kHz to 230 MHz according to IEC/EN 61000-4-6. The clamp can also be used for tests over its extended frequency range of 10 kHz to 1 GHz.
The cable connected between the Equipment Under Test (EUT) port to be tested and its Auxiliary Equipment (AE) is placed into the EM Clamp. The EM Clamp provides a means by which RF energy is coupled onto the cable and decoupled from the AE path, so that the energy is directed toward the EUT.
The CLEM-6146 incorporates split-core ferrites which allows the top half of the hinged enclosure to open so that the cable under test can easily be laid into position. Once closed, rotating the two knobs on the front of the clamp one-quarter turn engages the locking mechanism which compresses the top and bottom halves of the ferrites together around the cable.

The EM Clamp or a Bulk Current Injection Probe (BCIP)can be used for IEC/EN 61000-4-6 tests on ports/cables for which no Coupling/Decoupling Network (CDN) is available.
The key advantages to utilizing an EM Clamp, rather than a BCIP, are its power efficiency and decoupling properties. Com-Power’s EM Clamp is very efficient compared to other Injection Probes. To achieve a given test level, the CLEM-6146 requires only about 15% of the power needed to drive a typical Bulk Current Injection Probe. See ‘Typical Power Requirements’ graph.
Additionally, while BCIPs provide virtually no decoupling of the Auxiliary Equipment (AE), the EM Clamp does provide AE decoupling, especially at higher frequencies. See ‘Typical Decoupling Factor’ graph.