Near Field Probe Set with Contact Tip

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PS-500

400 Hz to 5 GHz

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PS-500 EMI troubleshooting probe kit

Near Field Probe Set with Contact Tip

  • ▸ Near field probe set with contact tip, 400 Hz–5 GHz — locates EMI emission sources on PCBs, cables, and enclosures, with added direct-contact circuit measurement.
  • ▸ Four-probe set: H-field loop, broadband E-field, fine-tip E-field, and contact-tip probe — H-field loop 9 kHz–5 GHz, broadband E-field 50 kHz–5 GHz, fine-tip E-field 100 kHz–5 GHz, contact-tip 400 Hz–5 GHz, all in a custom storage case.
  • ▸ Contact-tip probe for direct circuit contact — confirms the exact emission source via direct capacitive coupling to a trace or pin; supports up to 50 VDC on the probed circuit.
  • ▸ Patented fine-tip E-field probe (U.S. Patent #5,132,607) — pinpoints noise on individual IC pins and traces as narrow as 3 mils.
  • ▸ Three-stage workflow — broadband probe finds the hot-spot region, fine-tip probe isolates the trace or pin, and the contact tip confirms the source by direct contact.
  • ▸ H-field loop probe for current-driven emissions — detects magnetic fields from clock signals, serial data, switching power supplies, and transformer leakage.
  • ▸ Extended low-frequency reach (400 Hz) — the contact tip enhances power-integrity investigations beyond the PS-400 range.
  • ▸ BNC (female) interface; optional PAP-501 preamplifier (10 MHz–1000 MHz, 21 dB gain) — connects directly to a 50 Ω spectrum analyzer, EMI receiver, or oscilloscope; no calibrated test facility required.

PS-500 Features

  • ▸ Near field probe set with contact tip — PCB, cable, and enclosure EMI troubleshooting
  • ▸ Includes H-field loop, two E-field probes, and a contact-tip probe
  • ▸ Contact-tip probe: 400 Hz to 5 GHz — direct circuit contact for source confirmation
  • ▸ H-field loop probe: 9 kHz to 5 GHz — current-driven magnetic emissions
  • ▸ Broadband E-field probe: 50 kHz to 5 GHz — fast area scan for hot spots
  • ▸ Fine-tip E-field probe: 100 kHz to 5 GHz — isolates individual traces and IC pins
  • ▸ Fine-tip resolution down to 3 mil traces — U.S. Patent #5,132,607
  • ▸ Contact tip DC input: 50 VDC max — for low-voltage DC circuits
  • ▸ BNC (female) connector — direct mate to 50 Ω spectrum analyzer, EMI receiver, or oscilloscope
  • ▸ 1 kV dielectric breakdown — safe probing near energized circuits
  • ▸ Probe weight 4 oz (113 g) each
  • ▸ Optional PAP-501 preamplifier — 21 dB nominal gain, 10 MHz–1000 MHz
  • ▸ Supplied in a custom storage case

PS-500 Specifications

Parameter Specification
Model PS-500
Type Near field probe set with contact tip (H-field and E-field)
Probe Set Includes H-field loop, broadband E-field, fine-tip E-field, contact-tip
H-Field Probe Frequency Range 9 kHz to 5 GHz
Broadband E-Field Probe Frequency Range 50 kHz to 5 GHz
Fine-Tip E-Field Probe Frequency Range 100 kHz to 5 GHz
Contact-Tip Probe Frequency Range 400 Hz to 5 GHz
Connector BNC (female)
Dielectric Breakdown 1 kV
Contact Tip DC Input 50 VDC max
Probe Weight 4 oz (113 g) each
Fine-Tip Resolution Traces as narrow as 3 mils (U.S. Patent #5,132,607)
Storage Custom storage case
Optional Preamplifier PAP-501
PAP-501 Frequency Range 10 MHz to 1000 MHz
PAP-501 Nominal Gain 21 dB ± 2
PAP-501 Output at 1 dB Compression +10 dBm
PAP-501 Noise Figure 6 dB
PAP-501 Output Impedance 50 Ω
PAP-501 Power Input 6 VDC, 500 mA
Workflow: Use the broadband E-field probe to find the hot-spot region, the fine-tip probe to isolate the trace or pin, the contact tip to confirm the source by direct contact, and the H-field loop probe for current-driven emissions and enclosure-seam leakage.
Note: Near-field measurements are relative and used for design debugging and mitigation validation — final EMC compliance must be verified with an antenna at the specified distance in an accredited far-field test environment. The PS-500 adds the contact-tip probe over the PS-400 set.

Title Link
PS-500 Datasheet View PDF
PS-500 Manual View PDF

1. What additional capability does the PS-500 offer compared to PS-400?

PS-500 adds a contact tip probe covering 400 Hz to 5 GHz, enabling direct electrical contact with circuit nodes for enhanced diagnostic resolution.

2. What are the frequency ranges of each probe in the PS-500 set?

H-field loop 9 kHz to 5 GHz. Broadband E-field 50 kHz to 5 GHz. Fine tip 100 kHz to 5 GHz. Contact tip 400 Hz to 5 GHz. This extended low-frequency capability enhances power integrity investigations.

3. How are PS-500 probes connected to test instrumentation?

Probes connect via BNC to a spectrum analyzer, EMI receiver, or oscilloscope with 50-ohm input. Measurements are typically performed at known problematic emission frequencies identified during far-field scans.

4. When should PAP-501 or PAM-103 amplifiers be used with PS-500?

Amplifiers improve detection of weak emissions and enhance signal-to-noise ratio. The PAP-501 offers 21 dB gain across 10 MHz–1000 MHz and is suitable for most pre-compliance work. The PAM-103 may be selected for extended bandwidth or higher gain applications. Care must be taken to prevent overload or compression when measuring strong sources.

5. Why is a contact tip probe useful in EMI debugging?

The contact tip probe allows direct capacitive coupling to a trace or pin, reducing spatial ambiguity and confirming the exact emission source.

6. Is the contact tip safe for powered circuits?

It supports up to 50 VDC input and is intended for low-voltage DC circuits. Proper ESD precautions and safety practices must be observed.

7. What is the recommended troubleshooting sequence?

Begin with the broadband probe to identify hot regions. Use the fine tip to isolate specific traces or pins. Confirm with the contact tip for direct source validation. Use the H-field probe for current-driven emissions.

8. How does PS-500 assist in impedance mismatch detection?

By scanning along traces and observing amplitude variations, reflections and mismatches at terminations or vias can be identified.

9. Can PS-500 evaluate shielding effectiveness?

Yes. H-field probing along seams and apertures reveals leakage paths and bonding weaknesses.

10. What real-world systems commonly benefit from PS-500 use?

High-speed digital boards, embedded processors, SMPS circuits, RF subsystems, automotive ECUs, and industrial controllers.

11. Are measurements quantitative or comparative?

Primarily comparative. Engineers use probe readings to evaluate design changes rather than determine absolute compliance levels.

12. How does PS-500 help during pre-compliance testing?

It allows engineers to resolve dominant emission sources before entering expensive semi-anechoic chamber testing.

13. Can PS-500 identify emissions caused by long PCB traces?

Yes. Emission strength often correlates with trace length and coupling potential, which can be analyzed using localized scanning.

14. What setup practices improve measurement stability?

Keep cable routing stable, use short coax leads, avoid ground loops, and maintain consistent probe orientation.

15. Does PS-500 support advanced EMI diagnostics beyond PCB level?

Yes. It can analyze cable radiation, enclosure seams, connector leakage, and magnetic emissions from power conversion circuits.


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