Near Field Probe Set with Contact Tip

• H-Field Probe Frequency Range 9 kHz to 5 GHz
• Broadband Probe Frequency Range 50 kHz to 5 GHz
• Fine Tip Probe Frequency Range 100 kHz to 5 GHz
• Contact Tip Frequency Range 400 Hz to 5 GHz
• Probe Type H-field and E-field
• Connector BNC (female)
• Dielectric Breakdown 1 kV
• Contact Tip DC Input 50 VDC max
• Probe Weight 4 oz (113 g) each
• Optional Preamplifier PAP-501
• Frequency Range 10 MHz to 1000 MHz
• Nominal Gain 21 dB ±2
• Pout at 1 dB Compression +10 dBm
• Noise Figure 6 dB
• Output Impedance 50 Ohm
• Power Input 6 VDC, 500 mA

1. What additional capability does the PS-500 offer compared to PS-400?

PS-500 adds a contact tip probe covering 400 Hz to 5 GHz, enabling direct electrical contact with circuit nodes for enhanced diagnostic resolution.

2. What are the frequency ranges of each probe in the PS-500 set?

H-field loop 9 kHz to 5 GHz. Broadband E-field 50 kHz to 5 GHz. Fine tip 100 kHz to 5 GHz. Contact tip 400 Hz to 5 GHz. This extended low-frequency capability enhances power integrity investigations.

3. How are PS-500 probes connected to test instrumentation?

Probes connect via BNC to a spectrum analyzer, EMI receiver, or oscilloscope with 50-ohm input. Measurements are typically performed at known problematic emission frequencies identified during far-field scans.

4. When should PAP-501 or PAM-103 amplifiers be used with PS-500?

Amplifiers improve detection of weak emissions and enhance signal-to-noise ratio. The PAP-501 offers 21 dB gain across 10 MHz–1000 MHz and is suitable for most pre-compliance work. The PAM-103 may be selected for extended bandwidth or higher gain applications. Care must be taken to prevent overload or compression when measuring strong sources.

5. Why is a contact tip probe useful in EMI debugging?

The contact tip probe allows direct capacitive coupling to a trace or pin, reducing spatial ambiguity and confirming the exact emission source.

6. Is the contact tip safe for powered circuits?

It supports up to 50 VDC input and is intended for low-voltage DC circuits. Proper ESD precautions and safety practices must be observed.

7. What is the recommended troubleshooting sequence?

Begin with the broadband probe to identify hot regions. Use the fine tip to isolate specific traces or pins. Confirm with the contact tip for direct source validation. Use the H-field probe for current-driven emissions.

8. How does PS-500 assist in impedance mismatch detection?

By scanning along traces and observing amplitude variations, reflections and mismatches at terminations or vias can be identified.

9. Can PS-500 evaluate shielding effectiveness?

Yes. H-field probing along seams and apertures reveals leakage paths and bonding weaknesses.

10. What real-world systems commonly benefit from PS-500 use?

High-speed digital boards, embedded processors, SMPS circuits, RF subsystems, automotive ECUs, and industrial controllers.

11. Are measurements quantitative or comparative?

Primarily comparative. Engineers use probe readings to evaluate design changes rather than determine absolute compliance levels.

12. How does PS-500 help during pre-compliance testing?

It allows engineers to resolve dominant emission sources before entering expensive semi-anechoic chamber testing.

13. Can PS-500 identify emissions caused by long PCB traces?

Yes. Emission strength often correlates with trace length and coupling potential, which can be analyzed using localized scanning.

14. What setup practices improve measurement stability?

Keep cable routing stable, use short coax leads, avoid ground loops, and maintain consistent probe orientation.

15. Does PS-500 support advanced EMI diagnostics beyond PCB level?

Yes. It can analyze cable radiation, enclosure seams, connector leakage, and magnetic emissions from power conversion circuits.